A New Test Point Selection Method for Analog Continuous Parameter Fault.
Hui LuoWei LuYouren WangLing WangPublished in: J. Electron. Test. (2017)
Keyphrases
- high precision
- synthetic data
- parameter space
- cost function
- objective function
- preprocessing
- prior knowledge
- clustering method
- high accuracy
- computational cost
- regularization parameter
- experimental evaluation
- pairwise
- computational complexity
- signal processing
- support vector machine svm
- parameter estimation
- dynamic programming
- test cases
- classification method
- test data
- multiscale
- face recognition