Sign in
Impact of the switching mode on the read noise of ReRAM devices.
Kristoffer Schnieders
Stephan Aussen
Felix Cüppers
Susanne Hoffmann-Eifert
Stefan Wiefels
Published in:
NANOARCH (2023)
Keyphrases
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signal to noise ratio
random noise
noise level
noise model
mobile devices
computer screen
imaging devices
embedded systems
low snr
sensor noise
median filter
noise removal
image noise
missing data
multiresolution
high impact
multiscale
noise sensitivity