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Behavior of power MOSFETs during heavy ions irradiation performed after γ-rays exposure.

Giovanni BusattoValentina De LucaFrancesco IannuzzoAnnunziata SanseverinoFrancesco Velardi
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • databases
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  • power consumption
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  • human behavior
  • autonomous robots
  • power management