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Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits.

Keiko Makie-FukudaTakanobu AnboToshiro Tsukada
Published in: IEEE Trans. Instrum. Meas. (1999)
Keyphrases
  • mixed signal
  • integrated circuit
  • low power
  • multi channel
  • vlsi circuits
  • signal to noise ratio
  • signal processing
  • measurement error
  • digital circuits
  • electron beam