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High-speed electrical testing of multichip ceramic modules.

Dennis G. ManzerJohn P. KaridisKathleen M. WileyDominic C. BruenChristopher W. ClineCharles HendricksRobert N. WigginYuet-Ying Yu
Published in: IBM J. Res. Dev. (2005)
Keyphrases
  • high speed
  • low power
  • functional modules
  • real time
  • database
  • low cost
  • frame rate
  • artificial intelligence
  • mobile robot
  • source code
  • test cases
  • transmission line
  • printed circuit boards
  • test generation