A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs.
Tianjian LiFeng XieXiaoyao LiangQiang XuKrishnendu ChakrabartyNaifeng JingLi JiangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
- high precision
- classification method
- prior knowledge
- error rate
- experimental evaluation
- neural network
- classification accuracy
- high accuracy
- evaluation method
- test data
- synthetic data
- detection method
- main contribution
- computationally efficient
- probabilistic model
- cost function
- preprocessing
- similarity measure
- support vector machine
- mutual information
- computational cost
- dynamic programming
- support vector machine svm
- significant improvement
- experimental study
- multiscale
- decision trees
- optimization method
- statistical methods
- clustering algorithm