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Electrical Properties of Vapor-Grown Ge Junctions.

M. Jacqueline O'RourkeJohn C. MarinaceRichard L. AndersonWilliam H. White
Published in: IBM J. Res. Dev. (1960)
Keyphrases
  • electrical properties
  • silicon nitride
  • fiber optic
  • junction detection
  • line segments
  • multiscale
  • diffusion process
  • multi view
  • support vector
  • real time
  • neural network
  • data mining
  • high level
  • pairwise
  • probabilistic model