Self-testing of fully differential multistage circuits using common-mode excitation.

Wojciech Toczek

Published in: Microelectron. Reliab. (2008)

Keyphrases

search algorithm
multistage
dynamic programming
production system
single stage
lot sizing
stochastic programming
high speed
stochastic optimization
multistage stochastic
machine learning
test cases
finite horizon
capacity expansion
markov decision processes