Sign in
An On-Chip Loopback Block for RF Transceiver Built-In Test.
Marvin Onabajo
José Silva-Martínez
Félix O. Fernandez-Rodriguez
Edgar Sánchez-Sinencio
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2009)
Keyphrases
</>
high speed
neural network
relevance feedback
low cost
high density
image quality
statistical significance
radio frequency