LogDet Divergence-Based Metric Learning With Triplet Constraints and Its Applications.
Jiangyuan MeiMeizhu LiuHamid Reza KarimiHuijun GaoPublished in: IEEE Trans. Image Process. (2014)
Keyphrases
- metric learning
- semi supervised clustering
- subject to linear constraints
- distance metric
- distance metric learning
- learning tasks
- dimensionality reduction
- machine learning and pattern recognition
- pairwise similarities
- pairwise
- semi supervised
- pairwise constraints
- distance function
- multi task
- mahalanobis distance
- mahalanobis metric
- feature space
- semi supervised learning
- high dimensional
- feature extraction
- image classification
- neural network
- data mining