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CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out.

Abhairaj SinghMahdi ZahediTaha ShahroodiMohit GuptaAnteneh GebregiorgisManu KomalanRajiv V. JoshiFrancky CatthoorRajendra BishnoiSaid Hamdioui
Published in: AICAS (2022)
Keyphrases
  • random access memory
  • high speed
  • design considerations
  • modal logic
  • micron cmos
  • logic programming
  • computationally efficient
  • low voltage
  • analog vlsi
  • embedded dram
  • data structure
  • low cost
  • cmos technology