Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors.

Kalparupa Mukherjee Carlo De Santi Gaudenzio Meneghesso Enrico Zanoni Matteo Meneghini Shuzhen You Karen Geens Matteo Borga Benoit Bakeroot Stefaan Decoutere

Published in: IRPS (2020)

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