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A built-in self-test circuit for jitter tolerance measurement in high-speed wireline receivers.

Myeong-Jae ParkJaeha Kim
Published in: ITC (2014)
Keyphrases
  • high speed
  • data acquisition
  • low power
  • built in self test
  • frame rate
  • wireless networks
  • wireless communication
  • integrated circuit
  • real time
  • measurement data
  • measurement error
  • measurement model
  • shift register