A genetic programming approach to modeling power losses of Insulate Gate Bipolar Transistors.
Nicola FemiaMario MigliaroAntonio Della CioppaPublished in: CEC (2016)
Keyphrases
- genetic programming
- field effect transistors
- high density
- power losses
- evolutionary computation
- gene expression programming
- fitness function
- grammar guided genetic programming
- symbolic regression
- video sequences
- data sets
- power consumption
- multiple input
- regression problems
- modeling language
- low power
- positive and negative
- low cost
- computational intelligence
- image retrieval
- search algorithm
- image processing
- information systems