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Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon interposer base.

Chun-Chuan ChiErik Jan MarinissenSandeep Kumar GoelCheng-Wen Wu
Published in: ITC (2011)
Keyphrases
  • low cost
  • high speed
  • databases
  • real world
  • software testing
  • decision making
  • image sequences
  • multiscale
  • test set