Mastering the Mask: Harnessing Ensemble Learning for Defect Detection.
Cheng-Yuan HoJia-En WangPublished in: RIVF (2023)
Keyphrases
- ensemble learning
- defect detection
- generalization ability
- ensemble methods
- feature extraction
- random forest
- base classifiers
- ensemble classifier
- weak learners
- genetic algorithm
- benchmark datasets
- test data
- prediction accuracy
- support vector machine svm
- unlabeled data
- text mining
- multi class
- image processing
- learning algorithm