Cross-subject workload classification using pupil-related measures.
Tobias AppelChristian ScharingerPeter GerjetsEnkelejda KasneciPublished in: ETRA (2018)
Keyphrases
- pattern recognition
- feature space
- automatic classification
- classification accuracy
- classification systems
- classification method
- pattern classification
- classification algorithm
- benchmark datasets
- support vector machine svm
- text classification
- feature vectors
- supervised learning
- classification models
- artificial neural networks
- support vector
- feature selection
- multi class
- classification process
- real time
- training set
- machine learning
- neural network