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Reducing Pattern Delay Variations for Screening Frequency Dependent Defects.

Benjamin N. LeeLi-C. WangMagdy S. Abadir
Published in: VTS (2005)
Keyphrases
  • pattern matching
  • occurrence frequency
  • database
  • multiscale
  • image analysis
  • real time
  • learning algorithm
  • multiresolution
  • response time
  • low frequency
  • critical path
  • anti monotonic