Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects.
Zhining HuTobias SchlosserMichael FriedrichAndré Luiz Buarque Vieira e SilvaFrederik BeuthDanny KowerkoPublished in: CoRR (2024)
Keyphrases
- image data
- semiconductor manufacturing
- classification accuracy
- decision trees
- classification scheme
- automatic classification
- text classification
- support vector machine
- robust classification
- learning algorithm
- classification models
- machine learning methods
- unsupervised learning
- pattern recognition
- support vector
- multi agent
- feature extraction
- feature selection
- image classification
- model selection
- generative model
- supervised learning
- feature space
- pattern classification
- classification systems
- discriminative learning