Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault.
Wan-Yu LoChing-Yi ChenChin-Lung SuCheng-Wen WuPublished in: ATS (2008)
Keyphrases
- improved algorithm
- times faster
- computational complexity
- dynamic programming
- generation algorithm
- matching algorithm
- cost function
- computational cost
- worst case
- learning algorithm
- fault detection
- tree structure
- fault diagnosis
- experimental evaluation
- linear programming
- optimization algorithm
- k means
- path planning
- recognition algorithm
- decision trees
- probabilistic model
- input data
- expectation maximization
- computationally efficient
- theoretical analysis
- significant improvement
- objective function
- feature selection
- neural network