Trace signal selection methods for post silicon debugging.

Shridhar Choudhary Amir Masoud Gharehbaghi Takeshi Matsumoto Masahiro Fujita

Published in: VLSI-SoC (2015)

Keyphrases

significant improvement
computational cost
frequency domain
real time
data sets
data mining
genetic algorithm
image processing
machine learning methods
statistical methods
compressive sensing