Login / Signup

At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks.

Jongchul ShinHyunjin KimSungho Kang
Published in: DATE (1999)
Keyphrases
  • high speed
  • real time
  • optical flow
  • data sets
  • machine learning
  • computer vision
  • website
  • image segmentation
  • image sequences
  • test set