Login / Signup
Jongchul Shin
Publication Activity (10 Years)
Years Active: 1999-1999
Publications (10 Years): 0
</>
Publications
</>
Hyunjin Kim
,
Jongchul Shin
,
Sungho Kang
An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment.
ICCD
(1999)
Jongchul Shin
,
Hyunjin Kim
,
Sungho Kang
At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks.
DATE
(1999)