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Dependence of overcurrent failure modes of IGBT modules on interconnect technologies.
Imran Yaqub
Jianfeng Li
Christopher Mark Johnson
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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failure modes
fault tree
high speed
emerging technologies
modular structure
st century
human factors
database
learning algorithm
bayesian networks
computer science
information technology
building blocks
learning systems