Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems.
Anni LuJae HurYuan-Chun LuoHai LiDmitri E. NikonovIan A. YoungYang-Kyu ChoiShimeng YuPublished in: IEEE J. Emerg. Sel. Topics Circuits Syst. (2023)