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Fast chip aging prediction by product-like VMIN drift characterization on test structures.
S. E. Liu
G. Y. Chen
M. K. Chen
David Yen
W. A. Kuo
C. S. Fu
Y. S. Tsai
M. Z. Lin
Y. H. Fang
M. J. Lin
Published in:
IRPS (2018)
Keyphrases
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low cost
prediction accuracy
prediction model
high speed
prediction algorithm
wet lab
life cycle
test cases
age estimation
real time
data sets
prediction error
complex structures
built in self test