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Novel Three-Dimensional Beam Tracking System for Stationary-Sample-Type Atomic Force Microscopy.

Shao-Kang HungLi-Chen Fu
Published in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
  • three dimensional
  • atomic force microscopy
  • real time
  • image sequences
  • x ray
  • multi view
  • real world
  • information retrieval
  • case study
  • non stationary
  • test data
  • surface reconstruction