Printed Circuit Board Defect Detection Methods Based on Image Processing, Machine Learning and Deep Learning: A Survey.

Qin Ling Nor Ashidi Mat Isa

Published in: IEEE Access (2023)

Keyphrases

deep learning
machine learning
image processing
defect detection
feature extraction
active learning
unsupervised feature learning
semi supervised
image analysis
pattern recognition
computer vision
supervised learning
text mining
test images
machine vision
multiscale
decision trees