Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices.
Amirkoushyar ZiabariJe-Hyoung ParkEhsan K. ArdestaniJose RenauSung-Mo KangAli ShakouriPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
- pairwise
- integrated circuit
- significant improvement
- dynamic programming
- computational cost
- similarity measure
- clustering method
- preprocessing
- experimental evaluation
- neural network
- high accuracy
- probabilistic model
- synthetic and real images
- high precision
- segmentation method
- image restoration
- support vector machine svm
- low cost
- support vector machine
- image analysis
- image processing