A complement-based fast algorithm to generate universal test sets for multi-output functions.
Beyin ChenChung-Len LeePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
- test set
- learning algorithm
- times faster
- high accuracy
- detection algorithm
- objective function
- experimental evaluation
- optimization algorithm
- computational cost
- neural network
- dynamic programming
- cost function
- significant improvement
- computational complexity
- similarity measure
- image processing
- k means
- feature space
- preprocessing
- search algorithm
- segmentation algorithm
- optimal solution
- active learning
- search space
- test cases
- database
- noisy data
- recognition algorithm
- kolmogorov complexity