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Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection.
Kousuke Miyaji
Shuhei Tanakamaru
Kentaro Honda
Shinji Miyano
Ken Takeuchi
Published in:
IEEE J. Solid State Circuits (2011)
Keyphrases
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data sets
information systems
real time
three dimensional
steady state
power consumption
low power
high pressure