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Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.
Yu Cai
Erich F. Haratsch
Onur Mutlu
Ken Mai
Published in:
DATE (2012)
Keyphrases
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flash memory
solid state
random access
data mining
main memory
buffer management
real time
data sets
feature selection
data structure
data analysis
general purpose
multi dimensional