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Test power reduction and test pattern generation for multiple faults using zero suppressed decision diagrams.
J. P. Anita
P. Sudheesh
Published in:
Int. J. High Perform. Syst. Archit. (2016)
Keyphrases
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normal form
multiple faults
decision diagrams
binary decision diagrams
power reduction
multi valued
fault diagnosis
power consumption
discrete event
markov decision processes
low power
fuzzy logic
boolean functions
compressed data