A truncated test scheme design method for success-failure in-orbit tests.
Wenzhe DingXiang BaiQingwei WangFang LongHailin LiZhengrong WuJian LiuHuisheng YaoHong YangPublished in: Reliab. Eng. Syst. Saf. (2024)
Keyphrases
- detection method
- test data
- experimental evaluation
- test statistic
- learning scheme
- dynamic programming
- similarity measure
- preprocessing
- hybrid method
- computational cost
- classification accuracy
- support vector machine svm
- synthetic data
- high precision
- input data
- statistical tests
- data sets
- cost function
- pairwise
- neural network