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Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging.

Yi-Pin FangAnthony S. Oates
Published in: IRPS (2018)
Keyphrases
  • high speed
  • high density
  • data sets
  • data structure
  • real time
  • machine learning
  • image processing
  • error propagation
  • frequency distribution
  • error accumulation
  • transmission electron microscopy
  • errors occur