Login / Signup

Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks.

Biswajit BhowmikJatindra Kumar DekaSantosh Biswas
Published in: MASCOTS (2016)
Keyphrases
  • data analysis
  • statistical analysis
  • low cost
  • neural network
  • optimal solution
  • end to end
  • high bandwidth
  • data sets
  • evolutionary algorithm
  • closed form
  • computer networks
  • high density