Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment.
Mohsen RajiReza MahmoudiBehnam GhavamiSaeed KeshavarziPublished in: IEEE Access (2021)
Keyphrases
- digital circuits
- nano scale
- data flow
- evolvable hardware
- finite state machines
- circuit design
- significant improvement
- power system
- model based diagnosis
- database
- transmission line
- functional decomposition
- life span
- energy dissipation
- neural network
- np complete
- energy consumption
- primal dual
- cooperative
- reinforcement learning
- high voltage