Test of Supply Noise for Emerging Non-Volatile Memory.
Mohammad Nasim Imtiaz KhanSwaroop GhoshPublished in: ITC (2018)
Keyphrases
- main memory
- data mining
- noise level
- statistical tests
- additive noise
- information systems
- random noise
- test data
- signal to noise ratio
- noise model
- noise reduction
- noise sensitivity
- low memory
- memory size
- memory space
- noisy environments
- arbitrary shape
- real time
- index structure
- data warehouse
- data model
- data structure
- training data
- data sets