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Failure analysis for ultra low power nano-CMOS SRAM under process variations.

Jawar SinghJimson MathewDhiraj K. PradhanSaraju P. Mohanty
Published in: SoCC (2008)
Keyphrases
  • power consumption
  • low cost
  • database
  • statistical analysis
  • low power
  • data structure
  • high speed
  • data sets
  • data analysis
  • design process
  • data transmission
  • low voltage