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A stochastic kinematic model of class averaging in single-particle electron microscopy.

Wooram ParkCharles R. MidgettDean R. MaddenGregory S. Chirikjian
Published in: Int. J. Robotics Res. (2011)
Keyphrases
  • electron microscopy
  • x ray
  • kinematic model
  • low energy
  • image stacks
  • mechanical systems
  • computer vision
  • multi modal
  • motion planning
  • three dimensional
  • face recognition
  • dynamic programming
  • vision system