Reliability Testing of SiC MOS Devices at 500°C.

Ayayi C. Ahyi S. Dhar Zeynep Dilli Akin Akturk Neil Goldsman A. Ghanbari

Published in: IRPS (2019)

Keyphrases

software reliability
mobile devices
reliability analysis
test cases
highly reliable
real time
genetic algorithm
knowledge base
multiscale
data structure
test set
embedded systems
processing capabilities