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Inspection of Cracks in Aluminum Multilayer Structures Using Planar ECT Probe and Inversion Problem.

Dario Jeronimo PasadasArtur Lopes RibeiroHelena Maria Geirinhas RamosTiago Jorge Rocha
Published in: IEEE Trans. Instrum. Meas. (2017)
Keyphrases
  • image processing
  • image reconstruction
  • quality control
  • planar surfaces
  • data sets
  • neural network
  • digital images
  • complex structures
  • real time
  • printed circuit boards
  • parallel manipulator
  • automatic inspection