Tagged probabilistic simulation based error probability estimation for better-than-worst case circuit design.
Amr M. S. TossonSiddharth GargMohab H. AnisPublished in: VLSI-SoC (2013)
Keyphrases
- probability estimation
- circuit design
- worst case
- decision trees
- naive bayes
- multi class classification
- roc curve
- bayesian networks
- error rate
- upper bound
- generative model
- receiver operating characteristic
- classification trees
- probabilistic model
- training data
- logistic regression
- classification algorithm
- generalization error
- lower bound