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Transistor-level based defect tolerance for reliable nanoelectronics.

Aiman H. El-MalehBashir M. Al-HashimiAissa Melouki
Published in: AICCSA (2008)
Keyphrases
  • high speed
  • cost effective
  • database
  • databases
  • relational databases
  • feature selection
  • image segmentation
  • video sequences
  • hidden markov models
  • low level
  • higher level
  • lower level
  • defect detection