Login / Signup

Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture.

Deepashree SenguptaVivek MishraSachin S. Sapatnekar
Published in: DAC (2016)
Keyphrases
  • computer science
  • real time
  • management system
  • software architecture
  • high speed
  • network architecture
  • field effect transistors
  • analog vlsi
  • data sets
  • failure rate
  • highly reliable