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Structural and optical characterization of GaN grown on porous silicon substrate by MOVPE.
N. Chaaben
Tarek Boufaden
M. Christophersen
B. El Jani
Published in:
Microelectron. J. (2004)
Keyphrases
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semiconductor devices
liquid crystal
electron beam
high speed
low cost
structural information
optical imaging
charge coupled device
optical fiber
neural network
steady state
structural analysis
structural model
ccd camera
waveguide