Login / Signup

Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff.

Shingo ItoMathias PoikJohannes SchlarpGeorg Schitter
Published in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
  • atomic force microscopy
  • wide range
  • trade off
  • range data
  • content delivery
  • case study
  • metadata
  • similarity measure
  • evolutionary algorithm
  • multiresolution
  • end to end
  • allocation scheme
  • bandwidth requirements