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Soft error tolerant design of combinational circuits based on a local logic substitution scheme.
Mohammad Reza Rohanipoor
Behnam Ghavami
Mohsen Raji
Published in:
Microelectron. J. (2017)
Keyphrases
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logic circuits
error tolerant
logic synthesis
chip design
digital circuits
databases
asynchronous circuits
machine learning
image processing
pattern recognition
pairwise
image retrieval
query processing
pattern matching
built in self test