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Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications.

P. J. van der WelS. J. C. H. TheeuwenJ. A. BielenY. LiR. A. van den HeuvelJ. G. GommansF. van RijsP. BronH. J. F. Peuscher
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • power consumption
  • data sets
  • information systems
  • relevance feedback
  • failure detection
  • failure prediction
  • database systems
  • failure rate
  • radio frequency