Production test of an RF receiver chain based on ATM combining RF BIST and machine learning algorithm.

Sébastien Darfeuille Christophe Kelma

Published in: ECCTD (2011)

Keyphrases

learning algorithm
radio frequency
relevance feedback
built in self test
reinforcement learning
quality control
frequency band
rfid reader
data sets
image retrieval
active learning
learning rate
production planning
radio frequency identification